Patent · US Expired

Semiconductor device and method of fabricating

US6097051A · kind A · utility

32Cited by
8References
18Claims
0Family size

Assignee

Inventors

Key dates

Filing dateNov 25, 1996
Grant dateAug 1, 2000
Priority date
Expiry dateNov 25, 2016

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10B12/033

Abstract

A semiconductor device having a bottom electrode, a ferroelectric film, and a top electrode formed on a semiconductor substrate, wherein the angle of each of the main cross sectional sides of the ferroelectric film relative to the main surface of the semiconductor substrate is less than 75 degrees. Forming the ferroelectric film into the trapezoid in cross section having such an angle provides a microscopic capacitor without electrical short-circuit between the top and bottom electrodes if the top electrode, the ferroelectric film, and the bottom electrode are etched with single photolithography process step. The novel technique implements a microscopic memory cell structure suitable for highly integrated memory devices.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.