Patent · US Expired

Voltage excursion detection apparatus

US6100716A · kind A · utility

46Cited by
9References
32Claims
0Family size

Assignee

Inventors

Key dates

Filing dateSep 17, 1998
Grant dateAug 8, 2000
Priority date
Expiry dateSep 17, 2018

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH03K5/08
  • WIPO fieldBasic communication processes
  • WIPO sectorElectrical engineering

Abstract

It is common that the presence of a defect causes abnormal gate output voltage excursions in data buffers, AND gates, OR gates and multiplexers in current-mode logic circuits. A voltage excursion is detected by a voltage excursion detection apparatus which includes a built-in detector. The detector, which is little overhead, is used to monitor output swings of all gates (differential circuits) and flags all abnormal voltage excursions. These detection results cover classes of faults that cannot be tested by stuck-at testing methods only. The voltage detection apparatus works well below "at-speed" frequencies.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.