Patent · US Expired

Forward body biased field effect transistor providing decoupling capacitance

US6100751A · kind A · utility

47Cited by
22References
21Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMay 13, 1998
Grant dateAug 8, 2000
Priority date
Expiry dateMay 13, 2018

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D84/038
  • WIPO fieldBasic communication processes
  • WIPO sectorElectrical engineering

Abstract

In one embodiment of the invention, a semiconductor circuit includes a first group of field effect transistors that are forward body biased and have threshold voltages and a second group of field effect transistors that are not forward body biased and have threshold voltages that are higher than the threshold voltages of the first group of field transistors. In another embodiment of the invention, a semiconductor circuit includes first and second groups of field effect transistors. The circuit includes voltage source circuitry to provide voltage signals to bodies of the first group of field effect transistors to forward body bias the transistors of the first group. When the voltage signals are applied, the transistors of the first group have lower threshold voltages than do the transistors of the second group, except that there may be unintentional variations in threshold voltages due to parameter variations. Other aspects of the invention include forward biased decoupling transistors and a method of testing for leakage.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.