Apparatus and method for rapid 3D image parametrization
US6101269A · kind A · utility
37Cited by
5References
12Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Dec 19, 1997 |
| Grant date | Aug 8, 2000 |
| Priority date | — |
| Expiry date | Dec 19, 2017 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B11/2545
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method and apparatus for rapid three dimensional geometry parametrization of a three dimensional surface. A random speckle pattern is projected upon the surface and imaged to obtain a plurality of two dimensional digital images. The two dimensional images are processed to obtain a three dimensional characterization of the surface. The illuminated surface may be modeled to obtain a parameter set characterizing the surface based upon the two dimensional digital images.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.