Patent · US Expired

Method and apparatus for testing RFID tags

US6104291A · kind A · utility

218Cited by
47References
58Claims
0Family size

Assignee

Inventors

Key dates

Filing dateOct 6, 1998
Grant dateAug 15, 2000
Priority date
Expiry dateOct 6, 2018

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R31/2822
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

The present invention provides a method and apparatus for testing RFID tags using wireless radio frequency (RF) communication. The method and apparatus allow RFID tags to be tested individually or in groups while they are in close proximity to each other (e.g., within the read range of the tag).

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.