Apparatus for analysis of mixed gas components
US6107627A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Feb 6, 1998 |
| Grant date | Aug 22, 2000 |
| Priority date | — |
| Expiry date | Feb 6, 2018 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01J49/38
- WIPO fieldElectrical machinery, apparatus, energy
- WIPO sectorElectrical engineering
Abstract
The present invention provides an apparatus for the analysis of mixed gas components which can perform, in high precision, determination of the . quantities of components contained in a sample gas containing a plurality of the components having molecular weights close to each other and which has a Fourier transform mass spectrometric means for ionizing a sample gas, applying a high frequency electric field to the ionized gas to induce cyclotron resonance, detecting the cyclotron resonance as a high-frequency decaying electric signal, and converting the resulting high-frequency decaying electric signal to a frequency-domain signal and a wavelength variable light irradiating means for irradiating a light of a single wavelength to ionize the molecules of the components constituting the sample gas, said irradiating means being able to vary the wavelength and/or intensity of the irradiation light.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.