Spectral imaging apparatus and methodology
US6108082A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | May 21, 1999 |
| Grant date | Aug 22, 2000 |
| Priority date | — |
| Expiry date | May 21, 2019 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01J2003/2866
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method and apparatus for an improved spectral imaging system is provided. The system is capable of measuring the fluorescence, luminescence, or absorption at selected locations on a sample plate. The emissions detection subassembly can tune to any wavelength within a continuum of wavelengths utilizing an interferometric spectral discriminator. The interferometric spectral discriminator creates an interferogram from which the wavelength spectra for each pixel of the array can be calculated, typically using Fourier transform analysis. In one aspect, the chromatic accuracy of the system is calibrated using a calibration slit placed in the input aperture of the input relay lens but outside of the sample image. The slit is illuminated using a source of known wavelength. The fringe count versus the wavelength of the slit illumination source is monitored and used to calibrate the spectral discriminator. In another aspect, a transparent optic is included in the interferometric spectral discriminator that can be inserted into the beam path whenever a monochrome image of the sample is required. The optic produces a large offset in the legs of the interferometer resulting in the fringe dens…
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.