Patent · US Expired

Method for building and a structure of a contact end in a contact probe

US6111418A · kind A · utility

2Cited by
5References
13Claims
0Family size

Assignee

Inventors

Key dates

Filing dateFeb 19, 1998
Grant dateAug 29, 2000
Priority date
Expiry dateFeb 19, 2018

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R1/0735
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

In the contact probe 1 having an array of leads 3 densely attached to a surface of an insulative film 2, pressure contact ends are formed by one end of the leads 3 being arranged in an array along one end edge portion of the insulative film 3. Slots are formed in the one end edge portion of the insulative film 2 such that the slots 9 are open between adjacent contact ends. When the lead ends arranged in the array on the surface of the insulative film are contacted under pressure with a given electronic part, a sufficient degree of freedom of flexure of the contact ends is obtained, so that the contact ends are contacted under pressure with the external terminals of the electronic part.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.