High throughput surface plasmon resonance analysis system
US6111652A · kind A · utility
33Cited by
5References
20Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jul 6, 1999 |
| Grant date | Aug 29, 2000 |
| Priority date | — |
| Expiry date | Jul 6, 2019 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N21/553
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An apparatus and method for high throughput surface plasmon resonance (SPR) sensor subarray comprising two or more SPR sensor subarrays (10) having a target layer on an SPR layer (22), wherein the SPR sensor subarrays (10) are exposed to a solution until a baseline measurement is attained, is disclosed. Once the SPR sensor subarrays (10) have attained baseline, the SPR sensor subarrays (10) are used to determine the interaction properties between said SPR sensor subarray and a test entity.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.