Wavelength specific optical reflection meter/locator in signatured wavelength division multiplexed systems
US6111676A · kind A · utility
31Cited by
4References
11Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Feb 26, 1998 |
| Grant date | Aug 29, 2000 |
| Priority date | — |
| Expiry date | Feb 26, 2018 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04B10/071
- WIPO fieldTelecommunications
- WIPO sectorElectrical engineering
Abstract
In WDM systems, each wavelength travels over a different optical paths, thus having different reflections within the path. This method for detecting reflections in bidirectional multichannel communication systems uses a unique signature attached to each signal. This allows to isolate reflections within each optical path, by measuring the optical power of a signal and of the reflection, by measuring the power of the signal and the power of the reflection. The location of the reflection is determined by calculating the relative delay between the signal and the respective reflection.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.