Automatic sample changer for an X-ray diffractometer
US6111930A · kind A · utility
Assignee
Inventor
Key dates
| Filing date | Nov 16, 1998 |
| Grant date | Aug 29, 2000 |
| Priority date | — |
| Expiry date | Nov 16, 2018 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N23/20025
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A sample changer (2) for the automatic intake of a multitude of samples into the measurement position on the goniometer axis (a) of an X-ray diffractometer (20) in which the individual samples--each showing a surface, which meets the goniometer axis at a tangent in the measurement position--are linearly arranged on an insertable magazine (3). The samples on the magazine (3) can be moved in the direction of the goniometer axis (a) in order to transport each sample translationally into the measurement position. Furthermore the sample changer (2), the magazine (3) and the mountings (10) show recesses, which allow the refracted X-ray beams from the sample in transmission mode to pass through to the detector (14) unimpeded. The sample changer is suitable for reflection mode as well as transmission mode measurements without having to redesign the system.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.