Patent · US Expired

Flexible eddy current test probe

US6114849A · kind A · utility

20Cited by
5References
16Claims
0Family size

Assignee

Inventors

Key dates

Filing dateApr 17, 1998
Grant dateSep 5, 2000
Priority date
Expiry dateApr 17, 2018

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N27/9006
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

An eddy current test probe having a flexible sensor assembly for non-destructive testing of conductive parts. The flexible eddy current sensor assembly includes a coil assembly having a drive coil and a receive coil positioned in close proximity to each other to maximize inductive coupling. The drive coil receives an alternating voltage from an alternating voltage source. The receive coil is coupled to a visual display which displays the eddy current signal strength in appropriate units. The coil assembly is formed on a flexible membrane. The flexible membrane allows the coil assembly to contour to the PUT surface. By doing so, surface coupling is not only maintained but maximized between the PUT and the coil assembly which, in turn, improves the induced electromagnetic field. A wear resistant film is formed around the outside of the compliance membrane enclosing the coil assembly. The wear resistant film prevents damage to the coils from the inevitable surface irregularities and abrasive particles found in PUTs. The flexible membrane is layered on a flexible compliance membrane. The compliance membrane provides a degree of stiffness to the flexible membrane for maintaining close s…

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.