Two-dimensional position/orientation measuring mark, two-dimensional position/orientation measuring method and apparatus, control apparatus for image recording apparatus, and control apparatus for manipulator
US6115136A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Oct 7, 1998 |
| Grant date | Sep 5, 2000 |
| Priority date | — |
| Expiry date | Oct 7, 2018 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG05B19/401
- WIPO fieldControl
- WIPO sectorInstruments
Abstract
A mark is provided on an object surface of an object under measurement, and the mark provides two intersection points P.sub.1 and P.sub.2 between first and second straight lines L.sub.1, L.sub.2, and between second and third lines L.sub.2, L.sub.3, in which an angle ".alpha." defined by the first and second straight lines L.sub.1 and L.sub.2, another angle ".beta." defined by the second and third straight lines L.sub.2 and L.sub.3, and a distance between P.sub.1 and P.sub.2 are known. This mark is imaged on at least one set of one-dimensional optical sensor. When a sensor signal having a light intensity distribution along a longitudinal direction is outputted from the one-directional optical sensor, a calculation unit calculates positions of the straight lines L.sub.1 to L.sub.3 of the mark image on the one-dimensional optical sensor in response to the sensor signal. Based upon this calculation result, another calculation is made of at least one position of the two intersection points P.sub.1 and P.sub.2, and also an inclination of at least one straight line among the straight lines L.sub.1 to L.sub.3. For instance, this calculation result is used as a reference point for measuring…
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.