Patent · US Expired

Wordline activation delay monitor using sample wordline located in data-storing array

US6115310A · kind A · utility

6Cited by
13References
19Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJan 5, 1999
Grant dateSep 5, 2000
Priority date
Expiry dateJan 5, 2019

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG11C11/4091
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A wordline activation delay monitor circuit is disclosed herein which includes a sample wordline located within a data-storing array of a memory, wherein the sample wordline is selected or activated by circuitry having substantially the same structure or location within the memory as circuitry which selects or activates wordlines of the data-storing array. A circuit is disclosed which determines a wordline activation delay for a first subarray group within the memory by activating a sample wordline which is located within a data-storing array of a second subarray group. Corresponding methods are also disclosed.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.