Patent · US Expired

Installation for improving chemical-mechanical polishing operation

US6116991A · kind A · utility

8Cited by
9References
9Claims
0Family size

Assignee

Inventors

Key dates

Filing dateNov 25, 1998
Grant dateSep 12, 2000
Priority date
Expiry dateNov 25, 2018

Classification

  • Technology area (CPC B)Performing Operations; Transporting
  • CPC primaryB24B57/02
  • WIPO fieldMachine tools
  • WIPO sectorMechanical engineering

Abstract

A chemical-mechanical polishing station comprises a polishing table that has concentric rings. The rings are separated from each other by a small gap and all rings are capable of rotating in the same prescribed direction. A polishing pad is mounted on top of each ring, and a delivery tube is positioned at a distance above the polishing pads. The delivery tube further includes a tube handle and a tube surface, and the tube surface has a plurality of holes drilled in it for delivering slurry to the polishing pad surface. Each concentric ring of the polishing table is able to rotate such that all the rings have the same tangential polishing speed. Therefore a wafer surface can be more uniformly polished. Moreover, material having different density, roughness and chemical composition can be chosen to fabricate the polishing pads so that an even better polishing result can be obtained.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.