Patent · US Expired

Probe scanning mechanism for a scanning probe microscope

US6118121A · kind A · utility

7Cited by
13References
11Claims
0Family size

Assignee

Inventors

Key dates

Filing dateApr 6, 1999
Grant dateSep 12, 2000
Priority date
Expiry dateApr 6, 2019

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10S977/872
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A cantilever is attached to a moving block by means of a holder. Three sapphire plates are provided at a corner of the moving block so that their respective planes extend at right angles to one another. Three piezo-actuators are displaceable in directions intersecting at right angles to one another, and fixed with their one ends to stationary tables, respectively. Sapphire plates are attached individually to the respective other ends of the piezo-actuators. Each sapphire plate faces its corresponding sapphire plate on the moving block with ruby spheres between them. Two attracting magnets are attached individually to the respective sapphire plates at the center. The magnets face each other with a narrow enough space of, e.g., several micrometers between them.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.