Patent · US Expired

Method for increasing power supply bypassing while decreasing chip layer density variations

US6118169A · kind A · utility

1Cited by
1References
4Claims
0Family size

Assignee

Inventors

Key dates

Filing dateDec 1, 1998
Grant dateSep 12, 2000
Priority date
Expiry dateDec 1, 2018

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D84/90

Abstract

A method for increasing the layer density uniformity across a conductive layer, which comprises a plurality of functional blocks, of an integrated circuit is presented. Increased uniformity is achieved by tiling a plurality of capacitors in between the functional blocks. The configuration of the capacitor array and number of the capacitor cells in the array is arranged so as to provide approximate uniformity in the conductor-to-non-conductor density across the entire conductive layer. The capacitor array may be used to reduce power supply switching noise by coupling one or more of the capacitor cells making up the capacitor array between a high power rail and a low power rail.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.