Patent · US Expired

Method for predicting fault conditions in an intelligent electronic device

US6121886A · kind A · utility

38Cited by
3References
22Claims
0Family size

Assignee

Inventor

Key dates

Filing dateMay 18, 1999
Grant dateSep 19, 2000
Priority date
Expiry dateMay 18, 2019

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH02H3/44
  • WIPO fieldElectrical machinery, apparatus, energy
  • WIPO sectorElectrical engineering

Abstract

A method of predicting an eminent circuit breaker trip condition using an intelligent electronic device such as a trip unit, a protective relay, a power meter or other IED is presented. The intelligent electronic device includes a microcontroller and associated memories. An algorithm (program) stored in a memory of the intelligent electronic device generates a near-trip event for each trip event calculation if preset thresholds for the measured parameters are breached.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.