Patent · US Expired

Semiconductor memory device with a column redundancy occupying a less chip area

US6122194A · kind A · utility

10Cited by
2References
2Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJan 26, 2000
Grant dateSep 19, 2000
Priority date
Expiry dateJan 26, 2020

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG11C29/785
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A semiconductor memory device is provided which comprises a mat having a plurality of sectors for storing information of data; and a redundancy circuit for generating a plurality of redundancy selection signals to be applied in common to the sectors when the enable fuse element is open-circuited. Each of the sectors comprises a main memory cell array and the redundancy memory cell array divided into two redundant bit segments, each of which has two redundant columns of redundant memory cells. Each sector further comprises a first column selector for selecting one of the main columns of each bit segment in response to first column address signals; a second column selector for selecting one of the two redundant columns of each redundant bit segment in response to one of the first column address signals; and a third column selector for selecting one of the two bit segments in each input/output block and one of the two redundant bit segments in response to second column address signals. Furthermore, each sector has a plurality of sense amplifiers for sensing and amplifying stored data in corresponding main column and; redundant column thus selected; and a plurality of multiplexers each…

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.