X-ray inspection system
US6122344A · kind A · utility
Assignee
Inventor
Key dates
| Filing date | Oct 20, 1997 |
| Grant date | Sep 19, 2000 |
| Priority date | — |
| Expiry date | Oct 20, 2017 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N23/207
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An X-ray inspection system comprises an X-ray source (1) disposed to irradiate an object to be inspected (4) with a beam of X-rays in the form of a fan project from the source (1) through the object (4), detection means (6) capable of discriminating between the intensitities of X-rays coherently scattered through the object (4) at different angles to produce an output signal dependent on the intensity of the X-rays scattered through each of those angles and analyzing means (not shown) operably connected to the detention means (6) to process the output signal to determine the presence of X-rays coherently scattered through one or more pre-determined angles. Collimination means (23) is provided between the detection means (6) and the object (4) and is adapted to pass only X-rays coherently scattered at the different angles from a limited voxel (volume element) depth central at point P. Movement at the collimator (23) along the direction of the beam together with translation of the object by e.g. a conveyor (5) in the direction (22) allows the whole volume of the object, such as an item of baggage, to be scanned.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.