Patent · US Expired

Resistless device fabrication method

US6124146A · kind A · utility

0Cited by
7References
15Claims
0Family size

Assignee

Inventor

Key dates

Filing dateMay 15, 1998
Grant dateSep 26, 2000
Priority date
Expiry dateMay 15, 2018

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L21/2855
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A method of depositing a material to a semiconductor device having a first mesa structure, a second mesa structure and a valley. Material is deposited from a first angular direction sufficient to substantially mask the valley with a first of the mesa structures and from a second angular direction sufficient to substantially mask the valley with the second mesa structure to form a first lip and a second lip on the respective first and second mesa structures overlying the valley and defining a space therebetween less than the width of the valley. Material is then deposited to the device from a third direction in substantial opposition to the device, the space operating to guide material deposition to the valley to provide discrete material deposition in the valley to form a discrete feature in the valley.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.