Electrical test tool having easily replaceable electrical probe
US6127832A · kind A · utility
15Cited by
12References
16Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jan 6, 1998 |
| Grant date | Oct 3, 2000 |
| Priority date | — |
| Expiry date | Jan 6, 2018 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R1/06705
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Disclosed is an improved probe housing mechanism that will allow for the quick release of a probe tip from a testing tool. The invention includes a probe housing, a double cantilevered beam for holding a probe tip, and a releasable spring mechanism for holding the beam into place. The spring mechanism can be released by squeezing the spring together or by releasing a non-removable locking screw, thereby allowing the beam to be slidably removed from the probe housing for easy replacement.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.