Gas detecting method and its detector
US6128945A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Sep 1, 1998 |
| Grant date | Oct 10, 2000 |
| Priority date | — |
| Expiry date | Sep 1, 2018 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N27/122
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A metal oxide semiconductor is subjected to a temperature change, and signals measured at two timings in the course of the temperature change are used to define a two-dimensional topological space. In the topological space, two axis, an axis indicating the concentration of the gas to be detected and an axis corresponding to drift are defined, and the topological space is represented by an oblique coordinate system. The gas concentration is determined from projection of measured data onto the gas concentration axis.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.