Apparatus for analyzing radiating electromagnetic wave from multilayer substrate
US6129459A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Mar 23, 1998 |
| Grant date | Oct 10, 2000 |
| Priority date | — |
| Expiry date | Mar 23, 2018 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R29/0814
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The electromagnetic field intensity of an electromagnetic wave radiating from a multilayer substrate is correctly computed. A radiating electromagnetic wave analysis apparatus comprises a signal layer electric current distribution computation unit for obtaining the distribution of an electric current flowing through a signal layer in a distributed constant line approximation method or a transmission line analysis method; a multilayer substrate electric current distribution computation unit for computing the distribution of an electric current of an entire multilayer substrate in a moment method based on the distribution of the electric current obtained by the signal layer electric current distribution computation unit; and an electromagnetic field intensity computation unit for computing the electromagnetic field intensity of an electromagnetic wave radiating from a multilayer substrate based on the distribution of the electric current of the entire multilayer substrate computed by the multilayer substrate electric current distribution computation unit. The radiating electromagnetic wave analysis apparatus establishes a modelling method for quantitatively analyzing the state of the…
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