Patent · US Expired

Magnetron reactor for providing a high density, inductively coupled plasma source for sputtering metal and dielectric films

US6132575A · kind A · utility

29Cited by
21References
10Claims
0Family size

Assignee

Inventors

Key dates

Filing dateSep 28, 1998
Grant dateOct 17, 2000
Priority date
Expiry dateSep 28, 2018

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01J37/3405
  • WIPO fieldElectrical machinery, apparatus, energy
  • WIPO sectorElectrical engineering

Abstract

A magnetron reactor for providing a high density of plasma is disclosed. The reactor comprises a plasma reactor chamber that is adapted for receiving a processing gas in the chamber and is further adapted for connection to an evacuation source. A direct current driven magnetron is positioned within the reactor chamber and is adapted to hold a sputtering target. A movable substrate supporting pedestal, adapted to hold a substrate, is positioned within the reactor and is movable so as to place the substrate sufficiently proximate to the sputtering target to enable deposition of sputter products thereon. The substrate pedestal is connected to a first radio frequency signal source through an impedence matchbox having a phase shifting adjustment means. To provide a high density inductively coupled plasma, a radio frequency antenna, having a substrate end, is positioned about the chamber. The antenna is connected to a second radio frequency signal source through an impedence matchbox. The reactor of the present invention also includes an electromagnetic coil that is positioned around and adjacent to the substrate end of the radio frequency antenna.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.