Method and apparatus for slanted attitude testing and/or for co-planarity testing of a contact for SMD components

US6133579A · kind A · utility

Assignee

• Siemens Aktiengesellschaft · DE

Inventors

• Josef Wacker · Altusried, DE
• Hans-Horst Grasmueller · Fürstenfeldbruck, DE

Key dates

• Filing date: Dec 2, 1998
• Grant date: Oct 17, 2000
• Expiry date: Dec 2, 2018

Classification

• Technology area (CPC Y): Emerging Cross-Sectional Technologies
• CPC primary: Y10T29/49131
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

An entire contact row of an SMD component is illuminated by a light source direction in the direction of the contact row, and a shadow of the entire contact row is directed by a linear sensor. A shift of the contact row perpendicular to a contact surface formed by the contact row effects a shift of the position of the shadow on the linear sensor and also effects a modification of the expanse of the shadow. By identifying the minimum expanse of the shadow, a criterion for the co-planarity of the contact row derives from the minimum expanse itself and an indicator about the slanting attitude of the component derives from the position having the minimum expanse.