Patent · US Expired

Apparatus for detecting radiation and method for manufacturing such apparatus

US6133614A · kind A · utility

8Cited by
4References
12Claims
0Family size

Assignee

Inventors

Key dates

Filing dateAug 27, 1996
Grant dateOct 17, 2000
Priority date
Expiry dateAug 27, 2016

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10F39/8057

Abstract

A method for manufacturing a semiconductor apparatus for detecting radiation provided with phosphor comprises the steps of forming a phosphor layer integrally with a meshed partition plate having partitions per pixel of the semiconductor apparatus for detecting radiation, and of separating the phosphor per pixel by removing the phosphor on the partitioning portion of the partition plate by the irradiation of laser beam in the form of grooves together with the surface layer of the partitioning portions in order to make the phosphor thick to obtain a higher sensitivity, and also to make pixel pitches finer to enhance resolution, thus obtaining exact images without creating any cross talks between pixels.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.