Particle measuring apparatus
US6133995A · kind A · utility
Assignee
Inventor
Key dates
| Filing date | May 1, 1998 |
| Grant date | Oct 17, 2000 |
| Priority date | — |
| Expiry date | May 1, 2018 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2015/018
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A particle measuring apparatus includes a characteristic parameter extracting device for extracting a plurality of characteristic parameters from each particle in a sample, and a distribution diagram preparing device for preparing a first distribution diagram on the basis of the extracted characteristic parameters. It further includes a first separating device for separating a cluster including target particles from others on the prepared first distribution diagram. In addition, a discriminating device is included for setting a specified discrimination standard for the separated cluster including the target particles and for judging whether the particles in the cluster are target particles or non-target particles on the basis of the discrimination standard. Finally, a counting device is included for counting the number of the target particles on the basis of a discrimination result of the discriminating device.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.