Patent · US Expired

Diagnostic procedures in an integrated circuit device

US6134652A · kind A · utility

24Cited by
6References
19Claims
0Family size

Assignee

Inventor

Key dates

Filing dateDec 19, 1997
Grant dateOct 17, 2000
Priority date
Expiry dateDec 19, 2017

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06F11/3648
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

An on-chip breakpoint unit of an integrated circuit device is connected to receive the contents of an instruction pointer register via an address communication path. The breakpoint unit has a breakpoint register configured to hold a breakpoint address at which the normal operation of the CPU is to be interrupted for diagnostic purposes, and a comparator circuit operative to compare the breakpoint address with the contents of the instruction pointer register and to issue a breakpoint signal on a breakpoint signal path when there is a match. The on-chip breakpoint unit also has circuitry configured to inhibit generation of the breakpoint signal for a next instruction to be executed upon resumption of normal operation of the CPU after it has been interrupted.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.