System for conditioning an electron beam for improved free-electron laser operation
US6137811A · kind A · utility
3Cited by
5References
15Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jul 29, 1993 |
| Grant date | Oct 24, 2000 |
| Priority date | — |
| Expiry date | Jul 29, 2013 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH05H7/04
- WIPO fieldChemical engineering
- WIPO sectorChemistry
Abstract
A system is disclosed for developing a conditioned electron beam of high quality for an exemplary application to a free-electron source of coherent radiation. The system comprises: a source for producing an electron beam of relatively high energy, a microwave source for generating a microwave field, and a wiggler for generating transverse to the electron beam a periodic magnetic field which cooperates with the microwave field to interact with the electron beam and develop a conditioned electron beam of high quality.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.