Patent · US Expired

Method for manufacturing detector system for a computed tomography apparatus

US6137859A · kind A · utility

4Cited by

3References

22Claims

0Family size

Assignee

Siemens Aktiengesellschaft · DE

Inventors

Thomas Von Der Haar · Nuremberg, DE
Gerhard Kohl · Fairview Avenue, DE
Herbert Bruder · Hemhofen, DE

Key dates

Filing date	Feb 10, 1999
Grant date	Oct 24, 2000
Priority date	—
Expiry date	Feb 10, 2019

Classification

Technology area (CPC G)Physics
CPC primaryG01T1/2985
WIPO fieldEnvironmental technology
WIPO sectorChemistry

Abstract

In a method for manufacturing a detector system composed of a number of detector elements respectively disposed at installation positions in a computed tomography (CT) apparatus, the detector elements are allocated to respective installation positions on the basis of a table that, for at least one image-relevant physical property, contains at least the allowable upper limit value or the allowable lower limit value for the individual installation positions for the deviation of the property with respect to a detector element occupying a neighboring installation position.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.