Patent · US Expired

Method and system for the recognition of insulation defects

US6140821A · kind A · utility

5Cited by
1References
17Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJun 26, 1998
Grant dateOct 31, 2000
Priority date
Expiry dateJun 26, 2018

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R31/006
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

The invention concerns a method for the recognition of insulation defects in a circuit adapted for connection to a low-ohmic current source or sink having off-load voltage U.sub.n0, Towards this end the circuit is initially subjected, in a separated state, to a diagnostic voltage from a current limited current source or sink whose off-load voltage U.sub.h0 corresponds to exceeds or, respectively, is less than the voltage U.sub.n0. A decision is made as to the presence or absence of an insulation defect based on the current and/or voltage dependence during application of the diagnostic voltage. Finally, in the event that a defect is present, an error message is issued and the low-ohmic current source or sink is not connected to the circuit for self-diagnosis. Otherwise, the low-ohmic current source is connected to the circuit, or the sink, in sequential fashion for self-diagnosis testing. In this fashion even hidden insulation defects are recognized. The invention also concerns a system for carrying out this method.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.