Apparatus for measuring and applying instrumentation correction to produce a standard Raman spectrum
US6141095A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | May 18, 1999 |
| Grant date | Oct 31, 2000 |
| Priority date | — |
| Expiry date | May 18, 2019 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N21/65
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An apparatus for measuring and applying instrumentation correction to produce a standard Raman spectrum of a sample to be analyzed. A source of incident radiation is included. Also included are means for providing from the incident radiation an incident beam and a monitor beam. The incident beam is directed at the sample. The invention includes means for generating from the sample a Raman beam. Spectral data may be collected directly from the monitor beam and the Raman beam. Spectral data may be collected substantially simultaneously from the monitor beam and the Raman beam, or sequentially. One or more integral transforms are applied to spectral data to produce the standard Raman spectrum of the sample.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.