Patent · US Expired

Non-volatile semiconductor memory device and method of manufacturing the same

US6144584A · kind A · utility

51Cited by
7References
20Claims
0Family size

Assignee

Inventors

Key dates

Filing dateNov 3, 1998
Grant dateNov 7, 2000
Priority date
Expiry dateNov 3, 2018

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10B69/00
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

Source line select transistors are provided corresponding to word lines. The source line select transistors are turned on in response to signal voltages on the corresponding word lines to connect a main source line to corresponding sub-source lines. The sub-source lines are arranged corresponding to sets of word lines. Programming/erasing are performed by using channel hot electrons and a Fowler-Nordheim current, by applying voltages to the word lines and the bit lines such that an excessive voltage may not be transmitted from the main source line to the sub-source line. Memory cell data can be precisely read out without an influence by a leak current of an over-erased or over-programmed memory cell.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.