Data processing system external pin connectivity to complex functions
US6145104A · kind A · utility
4Cited by
10References
24Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Feb 12, 1998 |
| Grant date | Nov 7, 2000 |
| Priority date | — |
| Expiry date | Feb 12, 2018 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F11/2733
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
An integrated circuit containing a data processing system with a number of external peripheral pins utilizes the peripheral pins for both testing the corresponding peripherals and for parallel testing of other complex functions in a MCU. The MCU has a plurality of test modes that can be selected, with different peripheral pins being connected to a test circuit depending on which test mode is selected. This allows testing of peripherals via their corresponding pins, as well as other complex functions without the necessity of having dedicated test pins.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.