Patent · US Expired

State relaxation based subsequence removal method for fast static compaction in sequential circuits

US6145106A · kind A · utility

5Cited by
0References
6Claims
0Family size

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Key dates

Filing dateDec 31, 1997
Grant dateNov 7, 2000
Priority date
Expiry dateDec 31, 2017

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R31/318371
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A method for fast static compaction in sequential circuits with finite output states by removing subsequences of test vectors from a vector test set. The method has the following steps: (1) relaxing the output states of the sequential circuits; (2) identifying a candidate subsequence of test vectors from the vector test set for removal; (3) temporarily removing the candidate subsequence of test vectors from the vector test set; (4) performing fault simulation on remaining test vectors from the vector test set; (5) examining fault simulation results against a set of removal criteria; (6) permanently removing the temporarily removed candidate subsequence if said set of removal criteria are met; (7) replacing the temporarily removed candidate subsequence if said set of removal criteria are not met; and (8) repeating steps (1) through (7) until all candidate subsequences of test vectors have been identified.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.