Patent · US Expired

Test head for microstructures with interface

US6150830A · kind A · utility

35Cited by

4References

16Claims

0Family size

Assignee

Feinmetall GmbH · DE

Inventors

Rainer Schmid · Neckartenzlingen, DE
Klaus Giringer · Herrenberg, DE
Ulrich Gauss · Herrenberg, DE
Heinz Deusch · Aidlingen, DE

Key dates

Filing date	Nov 5, 1998
Grant date	Nov 21, 2000
Priority date	—
Expiry date	Nov 5, 2018

Classification

Technology area (CPC H)Electricity
CPC primaryH01R12/714
WIPO fieldElectrical machinery, apparatus, energy
WIPO sectorElectrical engineering

Abstract

A test head for making contact with test points arranged close to one another of an electric component. The test head having a plurality of contact elements which can be connected to a connecting element of a test device. The contact elements are in respective feed-through openings through two or three overlying guide panels. The contact elements are axially guidable in the feed-through openings in the panel. Various ways of securing the contact elements against falling out of the test head are provided, including friction locking of the contact elements in one panel, using a securing layer at one panel, laterally offsetting one panel with respect to the others, or by different diameters along the length of the contact element, e.g. by insulation selectively applied along the length. The connecting element and the device for making contact are detachably connected.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.