Patent · US Expired

Screened EEPROM cell

US6151245A · kind A · utility

9Cited by
5References
16Claims
0Family size

Assignee

Inventors

Key dates

Filing dateDec 17, 1998
Grant dateNov 21, 2000
Priority date
Expiry dateDec 17, 2018

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D89/00

Abstract

An EEPROM cell is described as having a screening metal structure formed of preference in the first metal layer and located in substantial overlaying relationship at the floating gate terminal. This defeats the possibility of anomalous readings being obtained by measuring the amount of charge on the floating gate terminal. An additional screening metal structure, to be formed in the third and following metal layers, may be provided to fully overlie the cell and provide additional protection against anomalous readings.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.