Retention factor database
US6153438A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | May 20, 1997 |
| Grant date | Nov 28, 2000 |
| Priority date | — |
| Expiry date | May 20, 2017 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2030/8804
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method for identifying analytes of interest by referencing to a retention factor database corresponding to a plurality of identified analytes that is independent of column dimensions and carrier gas type while dependent upon stationary phase type ratio and a relative temperature program. The retention factor database is generated on a reference GC system in which the column head pressure is adjusted to ensure high reproducibility of retention times by locking the column void time and/or the retention time of an identified analyte to a specific value such that accurate retention factors (k) can be calculated in accordance with the formula: ##EQU1## where VT is the void time of the column having a specified stationary phase and phase coating installed in a GC system operating in accordance to a specified temperature program (where time is expressed in units of column void time).
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.