Patent · US Expired

Bipolar transistor with polysilicon dummy emitter

US6153919A · kind A · utility

6Cited by
7References
5Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJan 26, 1999
Grant dateNov 28, 2000
Priority date
Expiry dateJan 26, 2019

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D84/038
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A manufacturing method for semiconductor components is disclosed which will allow better precision in the definition of the doped areas of the components and the separation of differently doped areas. A selectively shaped area of, for example, polysilicon, defining the area or areas to be doped, is deposited on the component before the masks are applied. This makes the fitting of the masks less critical, as they only have to be fitted within the area of the polysilicon layer. In this way an accuracy of 0.1 .mu.m or better can be achieved.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.