Patent · US Expired

System and method for testing distortion in transformers

US6154037A · kind A · utility

2Cited by
6References
12Claims
0Family size

Assignee

Inventors

Key dates

Filing dateOct 13, 1998
Grant dateNov 28, 2000
Priority date
Expiry dateOct 13, 2018

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R31/62
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

The present invention entails a circuit and method for determining the distortion created by a transformer used in data communications. The circuit according to the present invention comprises a transmitting circuit, a back matching circuit, and a subtracting circuit. The transmitting circuit generates a test signal to be transmitted into a transformer, the transmitting circuit having a transmitting output for coupling to a transformer. Once applied to the transformer, the test signal is distorted by the transformer, where the transformer creates harmonics of the test signal and other signal distortion. The back matching circuit generates a scaled test signal that is subtracted from the distorted test signal in the subtraction circuit. The result is a diminished peak at the test signal in comparison to the harmonics such that the distortion by the transformer can be determined using a measuring device with a relatively low dynamic range.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.