Method and apparatus for searching electromagnetic disturbing source and non-contact voltage probe apparatus therefor
US6154710A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Jan 9, 1998 |
| Grant date | Nov 28, 2000 |
| Priority date | — |
| Expiry date | Jan 9, 2018 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/002
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Voltages and currents of electromagnetic interference developed in cables or the like electrically connected to pieces of electronic equipment are respectively measured by non-contact voltage probes and non-contact current probes both of which have double coaxial cylindrical type inner and outer electrodes and wherein the outer electrode is grounded and a voltage output under capacitive coupling is taken out from the inner electrode. An effective component of energy of each propagating electromagnetic interference is calculated from the result of the measurements. An invading route of each electromagnetic interference is specified from the magnitude of the energy and the direction in which the energy flows. While the pieces of electronic equipment are being placed under operating conditions, the behavior of the electromagnetic interference can be accurately recognized and the invading route of each electromagnetic interference can be quantitatively specified according to a physical quantity.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.