Test procedure and test station for carrying out the test procedure

US6154712A · kind A · utility

Assignees

• Siemens Aktiengesellschaft · DE
• Hewlett-Packard Company, L.P. · US

Inventors

• Johann Breu · Rattiszell, DE
• Ludwig Pirkl · Kallmünz, DE
• Thomas Wagner · Kerpen, DE
• Peter Wojtalla · Selters (Westerwald), DE
• Franz Stegerer · Regensburg, DE
• Otto Voggenreiter · Hersbruck, DE
• Leon Masseus · Hersbruck, DE
• Mee-Moi Yap · Melaka City, MY
• Walter Juri · Hersbruck, DE

Key dates

• Filing date: Jan 25, 1999
• Grant date: Nov 28, 2000
• Expiry date: Jan 25, 2019

Classification

• Technology area (CPC G): Physics
• CPC primary: G01R31/316
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

A test procedure or test station for testing products, especially products completed on an assembly line type production process, performing the following steps: First, testing a parameter of a product with a first testing device using a first input signal to produce a first test result. Second, testing the same parameter of the product with a second testing device using a second input signal that is independent of the first input signal to produce a second test result. Third, deriving a differential value from the test results obtained by the testing devices. Fourth, determining the conformance of the testing station from the differential value and outputting an error message when the differential value deviates from a predetermined range. Fifth, repeating above steps for at least one other parameter.