Method for controlling a coordinate measuring in accordance with desired data
US6154713A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Mar 23, 1998 |
| Grant date | Nov 28, 2000 |
| Priority date | — |
| Expiry date | Mar 23, 2018 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG05B19/401
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The invention is directed to a method for controlling a coordinate measuring apparatus in accordance with desired data utilizing a movably journalled probe which continuously scans the surface of a workpiece in a scanning point in a preferred measurement direction (M). Either the probe or the workpiece therefore additionally rotatably journalled about at least one rotational axis having a first alignment. Geometric data are processed which include at least points (Pai, Pbi) on the surface of the workpiece with the points (Pai, Pbi) defining a line to be scanned. Control data (Lai, L.alpha.i and/or Lbi, L.beta.i) from the geometric data are computed for controlling the measuring sequence in such a manner that, for measuring the workpiece, the workpiece and/or the probe are rotated about the rotational axis.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.