Patent · US Expired

Semiconductor wafer and fabrication method of a semiconductor chip

US6159826A · kind A · utility

17Cited by
9References
10Claims
0Family size

Assignee

Inventors

Key dates

Filing dateSep 17, 1998
Grant dateDec 12, 2000
Priority date
Expiry dateSep 17, 2018

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L2924/01082
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

The present invention relates to a semiconductor device, and more particularly to a structure of a semiconductor wafer and a fabrication method of semiconductor chips. According to the present invention, a semiconductor wafer containing a plurality of semiconductor chip portions has a plurality of chip scribe lanes formed between the semiconductor chip portions. A plurality of chip bonding pads are formed on the semiconductor chip portions of the wafer, and a plurality of wafer probing pads are formed on the chip scribe lanes. The wafer probing pads are electrically connected to internal circuits of the semiconductor chip portions and/or to corresponding ones of the chip bonding pads.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.