Method and apparatus for performing optical frequency domain reflectometry
US6160826A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Jun 11, 1999 |
| Grant date | Dec 12, 2000 |
| Priority date | — |
| Expiry date | Jun 11, 2019 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01S5/146
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Method of performing OFDR on a sample comprising steps of: providing an external-cavity frequency-tuned laser having an optical cavity of effective length; tuning the laser to generate a change in wavelength; changing the effective length of the optical cavity proportionally to the change in wavelength so as to tune the longitudinal cavity mode frequency at the same rate as the wavelength is changed; directing light from the laser onto the sample; receiving light reflected from the sample; combining light reflected from the sample with light from the external-cavity frequency-tuned laser; detecting the combined light and generating a beat signal in response thereto; and performing digital signal processing to extract spatial information about the sample in response to the detected beat signal. An OFDR system is also disclosed comprising: a laser comprising an output port; an optical ring having a round trip time, a center frequency and a broad-bandwidth gain medium; a wavelength selecting device in optical communication with the gain medium; a frequency shifter in optical communication with the gain medium and the wavelength selecting device; and an optical coupler in optical commu…
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.