X-ray imaging system for determining area density of low density samples
US6167113A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | May 12, 1999 |
| Grant date | Dec 26, 2000 |
| Priority date | — |
| Expiry date | May 12, 2019 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2223/076
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An apparatus and method are disclosed for measuring the area density of a low density material sample. The system includes an x-ray emitter which emits x-rays in the range of 3 kilovolts to 20 kilovolts and the x-rays pass through the sample. An imaging device converts the x-rays which pass through the sample to visible light to produce a visible image corresponding to the sample and in which the visible image has an intensity which varies as a function of the area density across the sample. A camera produces an output signal representative of the intensity of the visible image across the sample while a computer processor processes the signal from the camera after digitization to produce an analysis of the area density of the sample.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.