Wafer probe with built in RF frequency conversion module
US6169410A · kind A · utility
87Cited by
6References
4Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Nov 9, 1998 |
| Grant date | Jan 2, 2001 |
| Priority date | — |
| Expiry date | Nov 9, 2018 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R1/06772
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A wafer probe with built in components to perform frequency multiplication, upconversion, downconversion, and mixing typically performed by an RF module of a vector network analyzer (VNA). The wafer probe is designed for testing integrated circuits used in collision avoidance radar systems and operates over the 76-77 GHz frequency range allocated by the Federal Communications Commission (FCC) for collision avoidance radars. To minimize costs, the wafer probe preferably utilizes integrated circuits for frequency multiplication, upconversion, downconversion, and mixing manufactured for collision avoidance radar systems.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.