Patent · US Expired

Method and system for measuring particles in a liquid sample

US6172376A · kind A · utility

7Cited by
26References
20Claims
0Family size

Assignee

Inventors

Key dates

Filing dateSep 14, 1998
Grant dateJan 9, 2001
Priority date
Expiry dateSep 14, 2018

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N2021/054
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

Provided are a method and apparatus for measuring particles in a liquid sample. The method involves introducing a liquid sample into a heat exchanger, thereby cooling the sample to a predetermined temperature. A particle measurement is performed on the cooled sample by introducing the cooled sample into a particle detector. The method and apparatus in accordance with the invention effectively suppress bubbles present in a liquid chemical sample being measured, thereby allowing for accurate particle measurements. The invention has particular applicability in the semiconductor and pharmaceutical manufacturing industries.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.