Patent · US Expired

Integrated circuit varactor having a wide capacitance range

US6172378A · kind A · utility

99Cited by
8References
27Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMay 3, 1999
Grant dateJan 9, 2001
Priority date
Expiry dateMay 3, 2019

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D1/66

Abstract

Integrated circuit varactor structures that include either an P-gate/N-well or N-gate/P-well layer configuration formed on an SOI substrate. The varactor structure is completely electrically isolated from the substrate of the IC by an oxide layer of the SOI substrate and by oxide-filled trenches formed on both sides of the varactor structures. The isolation trenches preferably extend to the oxide layer of the SOI substrate. The P-gate/N-well varactor structure includes N.sup.+ implant regions formed in an N-well implant layer of the varactor. The N.sup.+ implant regions comprise the source and the drain of a varactor. A LOCOS layer may be formed over the N-well layer where the P-gate is formed over the LOCOS layer. The P-gate may be formed of polysilicon. The N-gate/P-well varactor structure includes P.sup.+ implant regions formed in a P-well implant layer of the varactor. The P.sup.+ implant regions comprise the source and the drain of a varactor. A LOCOS layer may be formed over the P-well layer where the N-gate is formed over the LOCOS layer. The N-gate may be formed of polysilicon. The P-gate/N-well varactor is ideally suited for use as a binary or digitally-controlled varactor…

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.